Find a research partner or other support function connected to the large scale research facilities,
ESS & MAX IV. If you are not ready or not sure what you are looking for start here.
Curious about the nanoscale morphology of your material?
We help you explore structures where it really matters, on the nanoscale.
With SAXS, WAXS and GISAXS measurements, we provide reliable, high-quality characterization of materials at dimensions between 1–100 nm. SAXS delivers accurate structural insights while remaining non-destructive and requiring minimal sample preparation.
WAXS, like XRD, reveals crystalline properties such as lattice constants, symmetry and degree of crystallinity, giving you a deeper understanding of material structure. For surfaces and thin films, GISAXS enables detailed studies of nanostructured interfaces.
Planning advanced X-ray scattering studies?
Our SAXSpoint 2.0 system from Anton Paar enables analysis of nanostructured materials at a level approaching synchrotron performance, accessible and efficient.
We support a wide range of sample types, including liquids, solids, powders and thin films.
Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering (WAXS) and Grazing-Incidence Small-Angle X-ray Scattering (GISAXS).
We offer SAXS/WAXS/GISAXS measurements on nanostructured material on our SAXSpoint laboratory beamline. Contact us for research collaborations and consultations.
