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ForMAX beamline at MAX IV allows in-situ multiscale structural characterisation from nm to mm length scales by combining full-field tomographic imaging (TomographyNon-destructive 3D imaging reconstructed from many 2D projections. Includes X-ray CT (micro-CT and nano-CT), phase-contrast, XRD-CT, XRF-CT, ptychographic CT, and neutron tomography, each tuned to different samples.More info), small- and wide-angle x-ray scattering (SWAXS), and scanning SAXSSmall-Angle X-ray Scattering characterises structures at the nanometre scale (~1–100 nm) — particle sizes, shapes, pores, surface areas, self-organisation. Used for pharmaceuticals, polymers, coatings, food, and personal care.More info & WAXSWide-Angle X-ray Scattering probes atomic and molecular-scale ordering — crystalline phases, crystallinity, molecular packing, short-range order. Often paired with SAXS; used for polymers, fibres, cellulose, and bio-based materials.More info imaging in a single instrument.
The beamline operates at 8-25 keV, with a beam size at the sample of ≈ 1μm – 5 mm, depending on the mode of operation.
It is accessible for both general users (50%) and members of Treesearch (50%) through the MAX IV user program.
Introduction to ForMAX: https://www.youtube.com/watch?v=OyMf5ayqtbI
Research instrument for synchrotron-based experiments: In-situ multiscale structural characterisation through full-field tomographic imaging, small- and wide-angle x-ray scattering (SWAXS), and scanning SWAXS imaging.
Contact
Magnus Larsson Head of Industrial Relations
+46 725 546 309
