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Sectors Aeronautics and Automotive Bio-based materials and polymers Chemistry and Catalysis Construction Materials Cultural Heritage Electronics Energy Applications Environmental Engineering and Recycling Food and Agriculture Industrial production and Manufacturing Medtech - Biomedical engineering Metallurgy and Mining Nanotechnology and Nanomaterials Pharma and Biotechnology Surfaces and Interfaces

Capacity Beamlines & Instruments Education & Training Funding Research & Development Sample preparation & environments Seminar & conference

Position in Eco System Center Consultation & CRO Laboratory & Lab instruments Large-scale Infrastructure Projects & Networks Research Institute Support organisation University

Techniques AES - Auger Electron Spectroscopy APXPS/APPES - Ambient Pressure X-ray Photoelectron Spectroscopy ARPES - Angle-resolved Photoemission Spectroscopy BioSAXS CDI - Coherent Diffraction Imaging Chemical Crystallography EXAFS - X-ray Absorption Spectroscopy GISANS - Grazing Incidence Small-Angle Neutron Scattering GISAXS - Grazing Incidence Small Angle X-ray Scattering Grain mapping HAXPEEM - Hard X-ray Photoemission Electron Microscopy HAXPES - Hard X-ray Photoelectron Spectroscopy LEEM - Low Energy Electron Microscopy MX - Macromolecular Crystallography Neutron Reflectometry PDF - Atomic pair distribution function PED - Photo Electron Diffraction PEPICO - Photoelectron Photoion Coincidence Spectroscopy PES/XPS - Photoelectron Spectroscopy Phase-Contrast XCT PL - Photoluminescence Ptychography RIXS - Resonant Inelastic X-ray Scattering SANS - Small Angle Neutron Scattering SAXS - Small Angle X-ray Scattering SEM - Scanning Electron Microscopy Serial Crystallography SPELEEM - Spectroscopic PhotoElectron and Low Energy Electron Microscope STM - Scanning Tunneling Microscopy STXM - Scanning Transmission X-ray Microscopy TEM - Transmission Electron Microscopy Time-resolved studies TOFMS - Time-of-flight Mass Spectrometry TS - Total Scattering uXAS - Micro X-ray Absorption Spectoscopy WAXS - Wide Angle X-ray Scattering X-ray fluorescence imaging in 2D X-ray Radiography X-ray Tomography XANES/NEXAFS - X-ray Absorption Spectroscopy XLCD - X-ray Magnetic Linear Dichroism XMCD – X-ray Magnetic Circular Dichroism XPCS - X-ray Photon Correlation Spectroscopy XPEEM - X-ray Photoemission Electron Microscopy XRD - X-ray Powder Diffraction XRD-CT - X-ray Diffraction Computed Tomography XRF - X-ray Fluorescence

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Monochromator All Selected Si111 fixed-exit DCM Si311 fixed-exit DCM

Beamline All Selected Balder (Max IV Laboratory, Lund, Sweden)Another beamline (Another Facility)

Scan range All Selected EXAFS XANES

Temperature All Selected < RT RT RT >

Sample preparation All Selected Clamped Foil 13mm Pressed Pellet 5mm Pressed Pellet Clamped Mesh 25 µm 13mm Pellet Press 5 Mm Pressed Pellet 5 Mm Pressed Pellet 10 Mm Pressed Pellet Mesh

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HAXPEEM - Hard X-ray Photoemission Electron Microscopy

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Large-scale Infrastructure

Hard X-ray Photoelectron Spectroscopy P22

PETRA III

DESY, Hamburg

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The Hard X-Ray Photoelectron Spectroscopy beamline P22 is dedicated to study the electronic and atomic structure of surfaces, interfaces, and bulk materials, serving users from a diverse research fields.